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dc.contributor.authorChen, Chianen_US
dc.contributor.authorWang, Hsiuyingen_US
dc.date.accessioned2019-06-03T01:08:32Z-
dc.date.available2019-06-03T01:08:32Z-
dc.date.issued2019-04-08en_US
dc.identifier.issn0022-4065en_US
dc.identifier.urihttp://dx.doi.org/10.1080/00224065.2019.1571338en_US
dc.identifier.urihttp://hdl.handle.net/11536/151922-
dc.description.abstractTolerance intervals (TIs) are widely used in numerous industries, ranging from engineering to pharmaceuticals. In these applications, it is commonly assumed that data are normally distributed. However, the normality assumption may not apply in many situations, such as in the case of multiple production lines. As a result, the mixture normal distribution may be a more applicable model than the normal distribution to fit real data. Although the conventional distribution-free TI can be adopted for the mixture normal distribution, it leads to an unsatisfactory coverage probability when the sample size is not sufficiently large. In this study, we propose two Tls for the mixture normal distribution. The first is based the expectation-maximization (EM) algorithm combined with the bootstrap method and the second is based on the asymptotic property of sample quantiles. The simulation results show that the proposed TIs have coverage probability closer to the nominal level than the distribution-free interval. A real engineering data example is used to illustrate the methods.en_US
dc.language.isoen_USen_US
dc.subjectbootstrap methoden_US
dc.subjectdistribution-free intervalen_US
dc.subjectEM algorithmen_US
dc.subjectmixture normal distributionen_US
dc.subjectquantileen_US
dc.subjecttolerance intervalen_US
dc.titleTolerance interval for the mixture normal distributionen_US
dc.typeArticleen_US
dc.identifier.doi10.1080/00224065.2019.1571338en_US
dc.identifier.journalJOURNAL OF QUALITY TECHNOLOGYen_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.identifier.wosnumberWOS:000465817600001en_US
dc.citation.woscount0en_US
Appears in Collections:Articles