Full metadata record
DC FieldValueLanguage
dc.contributor.authorYang, Yueh-Chiehen_US
dc.contributor.authorKehn, Malcolm Ng Mouen_US
dc.date.accessioned2019-06-03T01:08:36Z-
dc.date.available2019-06-03T01:08:36Z-
dc.date.issued2019-05-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2019.2905212en_US
dc.identifier.urihttp://hdl.handle.net/11536/151973-
dc.description.abstractIn this paper, the surface-wave modal analysis of the transverse strip-grated dielectric-coated metal rod is done by using the asymptotic strip boundary conditions (ASBC) along with classical vector potentials in the cylindrical coordinate system. The yielded solvable system of linear equations is then cast into a homogeneous matrix equation, from which the characteristic equation as well as field distributions in explicit functional forms may be obtained. Modal dispersion diagrams and field distributions generated by this method are compared and validated with those simulated by an independent commercial full wave solver. The time cost by the ASBC method is also compared with that of the simulation software, upon which the vast superiority in speed of the proposed technique over the benchmark tool is demonstrated, but yet preserving high accuracy. Parametric studies that portray the variations of dispersion properties with various geometric attributes are carried out. Comparisons with its counterpart transverse corrugated rod are also carried out, and studies of dielectric losses are presented as well. A prototype was fabricated and measured, the experimental results of which concur well with theoretical expectations.en_US
dc.language.isoen_USen_US
dc.subjectAsymptotic strip boundary conditions (ASBC)en_US
dc.subjectdielectric lossen_US
dc.subjectsurface wavesen_US
dc.subjecttransverse strip-grated dielectric-coated roden_US
dc.subjectvector potentialsen_US
dc.titleAnalysis of Strip-Grated Dielectric-Coated Rods by Asymptotic Strip Boundary Conditions for Studies of Dielectric Losses and Field Localizationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMTT.2019.2905212en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume67en_US
dc.citation.issue5en_US
dc.citation.spage1740en_US
dc.citation.epage1752en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000467528800009en_US
dc.citation.woscount0en_US
Appears in Collections:Articles