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dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorYen, Ching-Hoen_US
dc.contributor.authorYang, Dong-Yuhen_US
dc.date.accessioned2014-12-08T15:21:23Z-
dc.date.available2014-12-08T15:21:23Z-
dc.date.issued2012-03-01en_US
dc.identifier.issn1435-246Xen_US
dc.identifier.urihttp://dx.doi.org/10.1007/s10100-010-0152-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/15209-
dc.description.abstractProcess yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. Chen et al. (Qual Reliab Eng Int 19:101-110, 2003) proposed a measurement formula called S-pk(T) which provides an exact measure of the overall process yield, for processes with multiple characteristics. In this paper, we considered the natural estimator of S-pk(T) under multiple samples, and derived the asymptotic distribution for the estimator. In addition, a comparison between the SB (standard bootstrap) and the proposed method based on the lower confidence bound is executed. Generally, the result indicates that the proposed approach is more reliable than the standard bootstrap method.en_US
dc.language.isoen_USen_US
dc.subjectAsymptotic distributionen_US
dc.subjectMultiple characteristicsen_US
dc.subjectProcess yielden_US
dc.subjectStandard bootstrapen_US
dc.titleProduction yield measure for multiple characteristics processes based on S-pk(T) under multiple samplesen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/s10100-010-0152-9en_US
dc.identifier.journalCENTRAL EUROPEAN JOURNAL OF OPERATIONS RESEARCHen_US
dc.citation.volume20en_US
dc.citation.issue1en_US
dc.citation.spage65en_US
dc.citation.epage85en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000299920600004-
dc.citation.woscount1-
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