完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, Yun-Hsuan | en_US |
dc.contributor.author | Chou, Yung-Lin | en_US |
dc.contributor.author | Chang, Shu-Wei | en_US |
dc.contributor.author | Wu, Chao-Hsin | en_US |
dc.date.accessioned | 2019-08-02T02:15:35Z | - |
dc.date.available | 2019-08-02T02:15:35Z | - |
dc.date.issued | 2019-07-07 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.5091050 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/152251 | - |
dc.description.abstract | We investigate the current gain of quantum-well heterojunction bipolar transistors (QW-HBTs) under different operation temperatures. It is experimentally shown that the introduction of a QW into the base region of HBTs results in an increasing current gain with the temperature, which is a behavior opposite to that of typical HBTs. An enhancement of current gain around 226% is observed as the temperature of QW-HBT is raised from 35 to 95 degrees C. This unusual trend is mainly attributed to the shorter escape time of electrons in the QW at the higher temperature. A modified charge-control model based on thermionic emissions of electrons in the QW region is constructed to model this temperature-dependent phenomenon, and the result agrees well with our experimental observations. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Thermally-enhanced current gain of quantum-well heterojunction bipolar transistor | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.5091050 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 126 | en_US |
dc.citation.issue | 1 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000474213800002 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |