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dc.contributor.authorYao, Jing-Nengen_US
dc.contributor.authorLin, Yueh-Chinen_US
dc.contributor.authorWong, Ying-Chiehen_US
dc.contributor.authorHuang, Ting-Juien_US
dc.contributor.authorHsu, Heng-Tungen_US
dc.contributor.authorSze, Simon M.en_US
dc.contributor.authorChang, Edward Yien_US
dc.date.accessioned2019-08-02T02:18:27Z-
dc.date.available2019-08-02T02:18:27Z-
dc.date.issued2019-06-07en_US
dc.identifier.issn2162-8769en_US
dc.identifier.urihttp://dx.doi.org/10.1149/2.0141906jssen_US
dc.identifier.urihttp://hdl.handle.net/11536/152284-
dc.description.abstractComposite channel (In0.65Ga0.35As/InAs/In0.65Ga0.35As) high electron mobility transistors (HEMTs) with pi-gate structure were investigated for high-speed and low-power logic applications. The conventional and tri-gate MESA HEMTs were compared with the pi-gate device for evaluation. The pi-gate device exhibited the best maximum transconductance value of 1584 mS/mm, on-state current of 332mA/mm, subthreshold swing (SS) of 78.1 mV/decade, and I-ON/I-OFF ratio of 3 x 10(4) at V-DS = 0.5 V at room temperature. These results indicated that the designed pi-gate InAs devices improve the electrical characteristics of InAs HEMTs for high-speed and low-power logic applications. (c) 2019 The Electrochemical Society.en_US
dc.language.isoen_USen_US
dc.titleCommunication-Potential of the pi-Gate InAs HEMTs for High-Speed and Low-Power Logic Applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/2.0141906jssen_US
dc.identifier.journalECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGYen_US
dc.citation.volume8en_US
dc.citation.issue6en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department國際半導體學院zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentInternational College of Semiconductor Technologyen_US
dc.identifier.wosnumberWOS:000470810500001en_US
dc.citation.woscount0en_US
Appears in Collections:Articles