完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chin, Albert | en_US |
dc.contributor.author | Shih, Cheng W. | en_US |
dc.contributor.author | Kan, Kai-Zhi | en_US |
dc.contributor.author | Chen, Tim | en_US |
dc.date.accessioned | 2019-09-02T07:45:39Z | - |
dc.date.available | 2019-09-02T07:45:39Z | - |
dc.date.issued | 2016-01-01 | en_US |
dc.identifier.isbn | 978-1-4673-9719-3 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/152547 | - |
dc.description.abstract | The power consumption in electronic devices is the major challenge as increasing the demand of IC chips. To lower the V-DD and AC power (P-AC), both high mobility material and steep turn-on device technology are useful. The ferroelectric high-K HfZrO MOSFET can realize not only a small sub-threshold slope (SS) < 60 mV/dec for low V-DD and P-AC, but also a smaller aspect ratio FinFET. The small bandgap (E-G) Ge pMOSFET can lower the P-AC by 4 times due to its 2x higher field-effective mobility at half effective field. The high-mobility wide E-G GaN MOSFET is a candidate to lower the direct tunneling leakage current and DC power (P-DC) by orders of magnitude in future deep X-nm device. The ferroelectric high-kappa HtZrO MOSFET can also perform DRAM function with lower P-DC than existing DRAM. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Ferroelectric, Small Bandgap and Wide Bandgap Materials for Ultra-Low Power Green Electronic Devices | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT) | en_US |
dc.citation.spage | 14 | en_US |
dc.citation.epage | 17 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000478951000002 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |