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dc.contributor.authorChin, Alberten_US
dc.contributor.authorShih, Cheng W.en_US
dc.contributor.authorKan, Kai-Zhien_US
dc.contributor.authorChen, Timen_US
dc.date.accessioned2019-09-02T07:45:39Z-
dc.date.available2019-09-02T07:45:39Z-
dc.date.issued2016-01-01en_US
dc.identifier.isbn978-1-4673-9719-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/152547-
dc.description.abstractThe power consumption in electronic devices is the major challenge as increasing the demand of IC chips. To lower the V-DD and AC power (P-AC), both high mobility material and steep turn-on device technology are useful. The ferroelectric high-K HfZrO MOSFET can realize not only a small sub-threshold slope (SS) < 60 mV/dec for low V-DD and P-AC, but also a smaller aspect ratio FinFET. The small bandgap (E-G) Ge pMOSFET can lower the P-AC by 4 times due to its 2x higher field-effective mobility at half effective field. The high-mobility wide E-G GaN MOSFET is a candidate to lower the direct tunneling leakage current and DC power (P-DC) by orders of magnitude in future deep X-nm device. The ferroelectric high-kappa HtZrO MOSFET can also perform DRAM function with lower P-DC than existing DRAM.en_US
dc.language.isoen_USen_US
dc.titleFerroelectric, Small Bandgap and Wide Bandgap Materials for Ultra-Low Power Green Electronic Devicesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)en_US
dc.citation.spage14en_US
dc.citation.epage17en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000478951000002en_US
dc.citation.woscount0en_US
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