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dc.contributor.authorPan, LiDongen_US
dc.contributor.authorHsu, C. S.en_US
dc.contributor.authorHuang, C. C.en_US
dc.date.accessioned2019-04-03T06:36:25Z-
dc.date.available2019-04-03T06:36:25Z-
dc.date.issued2012-01-11en_US
dc.identifier.issn0031-9007en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevLett.108.027801en_US
dc.identifier.urihttp://hdl.handle.net/11536/15261-
dc.description.abstractNull transmission ellipsometry was employed to study the field induced transition of the surface arrangements in freestanding films of smectic liquid crystals. The interlayer interaction between the two surfaces obtained from the threshold voltage for the transition is found to be antiferroelectric and is quasilong ranged. The possible microscopic origins of the measured interaction and its relevance to the interlayer interaction in antiferroelectric liquid crystal materials are discussed.en_US
dc.language.isoen_USen_US
dc.titleSurface-Surface Interaction in Smectic Liquid Crystal Filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevLett.108.027801en_US
dc.identifier.journalPHYSICAL REVIEW LETTERSen_US
dc.citation.volume108en_US
dc.citation.issue2en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000298991400028en_US
dc.citation.woscount3en_US
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