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dc.contributor.authorChiang, Yi-Tingen_US
dc.contributor.authorChou, Yien_US
dc.contributor.authorHuang, Chang-Hsunen_US
dc.contributor.authorLin, Wei-Tingen_US
dc.contributor.authorChou, Yi-Chiaen_US
dc.date.accessioned2019-09-02T07:46:16Z-
dc.date.available2019-09-02T07:46:16Z-
dc.date.issued2019-08-07en_US
dc.identifier.issn1466-8033en_US
dc.identifier.urihttp://dx.doi.org/10.1039/c9ce00539ken_US
dc.identifier.urihttp://hdl.handle.net/11536/152654-
dc.description.abstractWe investigated the vapor-solid-solid growth of Si nanowires from Ni silicides on Si(111), Si(110), and GaN substrates. The morphology and structures of Si on these substrates are distinct, and are dependent on substrate lattices and an epitaxy process during growth. The sidewall facets and epitaxy of silicides and Si were discussed. In addition, Si grown on GaN nanowires was investigated which led to the formation of branched nanowire structures. The Si nanowires/nanodots lie on the surface of GaN nanowires to maintain lower system energy. We manipulated the whole process in a UHV and studied the crystal growth of Si on different lattice substrates. Meanwhile, the process which occurred in a non-UHV led to less regularity on the NiSi2 crystal facets and interface epitaxy between NiSi2 and Si nanowires.en_US
dc.language.isoen_USen_US
dc.titleDependence of the structure and orientation of VSS grown Si nanowires on an epitaxy processen_US
dc.typeArticleen_US
dc.identifier.doi10.1039/c9ce00539ken_US
dc.identifier.journalCRYSTENGCOMMen_US
dc.citation.volume21en_US
dc.citation.issue29en_US
dc.citation.spage4298en_US
dc.citation.epage4304en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000476813200007en_US
dc.citation.woscount0en_US
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