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dc.contributor.authorMoroshkin, P.en_US
dc.contributor.authorLeiderer, P.en_US
dc.contributor.authorMoeller, Th. B.en_US
dc.contributor.authorKono, K.en_US
dc.date.accessioned2019-09-02T07:46:20Z-
dc.date.available2019-09-02T07:46:20Z-
dc.date.issued2019-07-01en_US
dc.identifier.issn1070-6631en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.5110530en_US
dc.identifier.urihttp://hdl.handle.net/11536/152714-
dc.description.abstractElectrically charged metallic microparticles and nanoparticles have been trapped under a free surface of superfluid He-4 in a vertical static electric field. We report the details of the trapping technique and the observed dynamics of the trapped particles moving along the surface and driven by surface waves, by a static horizontal electric field, and by a thermal counterflow within the surface layer of liquid He.en_US
dc.language.isoen_USen_US
dc.titleTrapping of metallic nanoparticles under the free surface of superfluid helium in a static electric fielden_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.5110530en_US
dc.identifier.journalPHYSICS OF FLUIDSen_US
dc.citation.volume31en_US
dc.citation.issue7en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department國際半導體學院zh_TW
dc.contributor.departmentInternational College of Semiconductor Technologyen_US
dc.identifier.wosnumberWOS:000478678600066en_US
dc.citation.woscount0en_US
Appears in Collections:Articles


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