完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Moroshkin, P. | en_US |
dc.contributor.author | Leiderer, P. | en_US |
dc.contributor.author | Moeller, Th. B. | en_US |
dc.contributor.author | Kono, K. | en_US |
dc.date.accessioned | 2019-09-02T07:46:20Z | - |
dc.date.available | 2019-09-02T07:46:20Z | - |
dc.date.issued | 2019-07-01 | en_US |
dc.identifier.issn | 1070-6631 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.5110530 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/152714 | - |
dc.description.abstract | Electrically charged metallic microparticles and nanoparticles have been trapped under a free surface of superfluid He-4 in a vertical static electric field. We report the details of the trapping technique and the observed dynamics of the trapped particles moving along the surface and driven by surface waves, by a static horizontal electric field, and by a thermal counterflow within the surface layer of liquid He. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Trapping of metallic nanoparticles under the free surface of superfluid helium in a static electric field | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.5110530 | en_US |
dc.identifier.journal | PHYSICS OF FLUIDS | en_US |
dc.citation.volume | 31 | en_US |
dc.citation.issue | 7 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 國際半導體學院 | zh_TW |
dc.contributor.department | International College of Semiconductor Technology | en_US |
dc.identifier.wosnumber | WOS:000478678600066 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |