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dc.contributor.authorHuang, Tsung-Linen_US
dc.contributor.authorPeng, Kang-Pingen_US
dc.contributor.authorChen, Ching-Lunen_US
dc.contributor.authorLin, Horng-Chihen_US
dc.contributor.authorGeorge, Tomen_US
dc.contributor.authorLi, Pei-Wenen_US
dc.date.accessioned2019-09-02T07:46:20Z-
dc.date.available2019-09-02T07:46:20Z-
dc.date.issued2019-08-05en_US
dc.identifier.issn2045-2322en_US
dc.identifier.urihttp://dx.doi.org/10.1038/s41598-019-47806-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/152720-
dc.description.abstractWe report the novel tunability of the diameters and spacings of paired Ge double quantum dots (DQDs) using nano-spacer technology in combination with selective oxidation of Si0.85Ge0.15 at high temperature. Pairs of spherical-shaped Ge QDs were formed by the selective oxidation of poly-SiGe spacer islands at each sidewall corner of the nano-patterned Si3N4/poly-Si ridges. The diameters of the Ge spherical QDs are essentially determined by geometrical conditions (height, width, and length) of the nano-patterned spacer islands of poly-SiGe, which are tunable by adjusting the process times of deposition and etch back for poly-SiGe spacer layers in combination with the exposure dose of electron-beam lithography. Most importantly, the separations between the Ge DQDs are controllable by adjusting the widths of the poly-Si/Si3N4 ridges and the thermal oxidation times. Our self-organization and self-alignment approach achieved high symmetry within the Ge DQDs in terms of the individual QD diameters as well as the coupling barriers between the QDs and external electrodes in close proximity.en_US
dc.language.isoen_USen_US
dc.titleTunable diameter and spacing of double Ge quantum dots using highly-controllable spacers and selective oxidation of SiGeen_US
dc.typeArticleen_US
dc.identifier.doi10.1038/s41598-019-47806-0en_US
dc.identifier.journalSCIENTIFIC REPORTSen_US
dc.citation.volume9en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000478743700015en_US
dc.citation.woscount0en_US
Appears in Collections:Articles