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dc.contributor.authorTu, K. N.en_US
dc.contributor.authorGusak, A. M.en_US
dc.date.accessioned2019-10-05T00:08:46Z-
dc.date.available2019-10-05T00:08:46Z-
dc.date.issued2019-08-21en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.5111159en_US
dc.identifier.urihttp://hdl.handle.net/11536/152855-
dc.description.abstractWe have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given. Published under license by AIP Publishing.en_US
dc.language.isoen_USen_US
dc.titleA unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy productionen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.5111159en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume126en_US
dc.citation.issue7en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department國際半導體學院zh_TW
dc.contributor.departmentInternational College of Semiconductor Technologyen_US
dc.identifier.wosnumberWOS:000483849000041en_US
dc.citation.woscount0en_US
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