標題: | NV-BNN: An Accurate Deep Convolutional Neural Network Based on Binary STT-MRAM for Adaptive AI Edge |
作者: | Chang, Chih-Chcng Wu, Ming-Hung Lin, Jia-Wei Li, Chun-Hsien Parmar, Vivek Lee, Heng-Yuan Wei, Jeng-Hua Sheu, Shyh-Shyuan Suri, Manan Chang, Tian-Sheuan Hou, Tuo-Hung 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-一月-2019 |
摘要: | Binary STT-MRAM is a highly anticipated embedded non-volatile memory technology in advanced logic nodes <28 nm. How to enable its in-memory computing (IMC) capability is critical for enhancing AI Edge. Based on the soon-available STT-MRAM, we report the first binary deep convolutional neural network (NV-BNN) capable of both local and remote learning. Exploiting intrinsic cumulative switching probability, accurate online training of CIFAR-10 color images (similar to 90%) is realized using a relaxed endurance spec (switching <= 20 times) and hybrid digital/IMC design. For offline training, the accuracy loss due to imprecise weight placement can be mitigated using a rapid non-iterative training-with-noise and fine-tuning scheme. |
URI: | http://dx.doi.org/10.1145/3316781.3317872 http://hdl.handle.net/11536/152982 |
ISBN: | 978-1-4503-6725-7 |
DOI: | 10.1145/3316781.3317872 |
期刊: | PROCEEDINGS OF THE 2019 56TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC) |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 會議論文 |