完整後設資料紀錄
DC 欄位語言
dc.contributor.authorZheng, Hao-Xuanen_US
dc.contributor.authorChen, Min-Chenen_US
dc.contributor.authorChang, Ting-Changen_US
dc.contributor.authorSu, Yu-Tingen_US
dc.contributor.authorChen, Wen-Chungen_US
dc.contributor.authorHuang, Wei-Chenen_US
dc.contributor.authorWu, Pei-Yuen_US
dc.contributor.authorTan, Yung-Fangen_US
dc.contributor.authorXu, You-Linen_US
dc.contributor.authorZhang, Yong-Cien_US
dc.contributor.authorMa, Xiao-Huaen_US
dc.contributor.authorHao, Yueen_US
dc.contributor.authorSze, Simon M.en_US
dc.date.accessioned2019-12-13T01:12:22Z-
dc.date.available2019-12-13T01:12:22Z-
dc.date.issued2019-11-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2019.2937278en_US
dc.identifier.urihttp://hdl.handle.net/11536/153227-
dc.description.abstractThis article explains the difference in the reset processes between single RRAM and 1T1R RRAM structures. In the single RRAM, as the reset voltage increases, the off-state resistance increases. This is a normal RRAM operation. However, in the 1T1R structure, the reset voltage increases while the OFF-state resistance does not increase. This may be caused by either current or voltage being insufficient to switch the RRAM to its higher resistance state. The measurements of real voltage indicate that the insufficient voltage is in fact the main cause. For the 1T1R RRAM structure, if it is to be reset to a higher resistance state, it is best done by increasing the gate voltage to increase the OFF-state resistance. Therefore, we provide a method to reduce the misjudgment in the array, and it would be beneficial for the development of high-density memory.en_US
dc.language.isoen_USen_US
dc.subjectResistanceen_US
dc.subjectTransistorsen_US
dc.subjectVoltage measurementen_US
dc.subjectElectrical resistance measurementen_US
dc.subjectElectric potentialen_US
dc.subjectCurrent measurementen_US
dc.subjectLogic gatesen_US
dc.subjectpinchoffen_US
dc.subjectreset processen_US
dc.subjectresistance random access memory (RRAM)en_US
dc.titleOvercoming Limited Resistance in 1T1R RRAM Caused by Pinch-Off Voltage During Reset Processen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2019.2937278en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume66en_US
dc.citation.issue11en_US
dc.citation.spage4706en_US
dc.citation.epage4709en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000494419900027en_US
dc.citation.woscount0en_US
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