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dc.contributor.authorLiu, Xiaolongen_US
dc.contributor.authorJuan, Apuaen_US
dc.contributor.authorChen, Riqingen_US
dc.contributor.authorYuan, Shyan-Mingen_US
dc.date.accessioned2020-01-02T00:03:29Z-
dc.date.available2020-01-02T00:03:29Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-7281-3745-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/153341-
dc.description.abstractAutomated testing is critical for the complex products development and manufacture. In generally, connecting multiple test environments in geographical distributed environment to share resources is a way to reduce cost. However, it conflicts with the principle of "keep test environment clean". Moreover, high latency between geographical different networks may impact origin automated test activities in reality. In this paper, we propose an automated testing framework for geographical distributed testing environment to solve the problems of sharing resources. In the proposed framework, improved Test Harness (TH) and integrated Test as a Service (TaaS) are proposed to assure automated testing flow and guarantee test integrity. The proposed framework may not impact origin automated test activities, which could reduce the cost of test activities in really. In addition, a basic implementation of Test Harness and TaaS Console in the proposed framework are presented in this paper.en_US
dc.language.isoen_USen_US
dc.subjectAutomated testen_US
dc.subjectGeographical distributed testingen_US
dc.subjectTest environmenten_US
dc.subjectTest as a Service (TaaS)en_US
dc.subjectTest harnessen_US
dc.titleAutomated Testing Framework for Geographical Distributed Testing Environmenten_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE INTERNATIONAL CONFERENCE ON INDUSTRY 4.0, ARTIFICIAL INTELLIGENCE, AND COMMUNICATIONS TECHNOLOGY (IAICT)en_US
dc.citation.spage31en_US
dc.citation.epage36en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000498522100006en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper