完整後設資料紀錄
DC 欄位語言
dc.contributor.authorPeng, Kang-Pingen_US
dc.contributor.authorHuang, Tsung-Linen_US
dc.contributor.authorGeorge, Thomasen_US
dc.contributor.authorLin, Horng-Chihen_US
dc.contributor.authorLi, Pei-Wenen_US
dc.date.accessioned2020-01-02T00:03:29Z-
dc.date.available2020-01-02T00:03:29Z-
dc.date.issued2019-01-01en_US
dc.identifier.issn2161-4636en_US
dc.identifier.urihttp://hdl.handle.net/11536/153344-
dc.description.abstractWe report the tunability of the sizes and inter-dot spacings of Ge coupled quantum dots (QDs) using nano-spacer technology in combination with selective oxidation of Si0.85Ge0.15. Spherical-shaped Ge QDs were formed at each sidewall corner of the nano-patterned Si3N4 ridges by thermal oxidation of poly-SiGe spacer layers encapsulating the Si3N4 nano-ridges. The diameters of the Ge spherical QDs are essentially determined by geometrical height, width, and length of the nano-spacer islands of poly-SiGe, which are tunable by adjusting the process times of their deposition and etch back. The inter-dot spacing between the Ge DQDs are controllable by adjusting the widths of the lithographically-patterned Si3N4 ridges and the thermal oxidation times. Our self-organization and self-alignment approach achieved high symmetry within the Ge DQDs in terms of the individual QD sizes as well as the coupling barriers between the QDs and external electrodes in close proximity.en_US
dc.language.isoen_USen_US
dc.subjectphotoMOSFETsen_US
dc.subjectGeen_US
dc.subjectSOIen_US
dc.titleFeasibility of Ge double quantum dots with high symmetry and tunability in size and inter-dot spacingen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 SILICON NANOELECTRONICS WORKSHOP (SNW)en_US
dc.citation.spage55en_US
dc.citation.epage56en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000501001400026en_US
dc.citation.woscount0en_US
顯示於類別:會議論文