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dc.contributor.authorChang, Ai-Tangen_US
dc.contributor.authorChang, Yi-Renen_US
dc.contributor.authorChi, Sienen_US
dc.contributor.authorHsu, Longen_US
dc.date.accessioned2014-12-08T15:21:34Z-
dc.date.available2014-12-08T15:21:34Z-
dc.date.issued2010en_US
dc.identifier.isbn978-0-8194-8258-7en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/15335-
dc.identifier.urihttp://dx.doi.org/10.1117/12.860934en_US
dc.description.abstractIn an optical tweezers system, the force measurement with a resolution less than pico-Newton can be achieved by precise measurement and analysis of the trapped particle trajectory. Typically, this single particle tracking technique is realized by a quadrant position sensor which detects the scattering lights of the trapping laser beam from the trapped particle. However, as the radius of the trapped particle is larger than the wavelength of the trapped laser, the scattering pattern becomes complicated, and it limits the tracking region and the signal sensitivity on the trapped particle. To solve this issue, an extra probing laser with optimized focal offset according to the trapping laser is applied to improve the flexibility and performance of our particle tracking system for each particle size. A rule of thumb between the optimized focal offsets and particle size is also concluded from the experimental results and theoretical simulations.en_US
dc.language.isoen_USen_US
dc.subjectphotonic force microscopyen_US
dc.subjectquadrant-photo detectoren_US
dc.subjectparticle trackingen_US
dc.titleThe single particle tracking systemen_US
dc.typeArticleen_US
dc.identifier.doi10.1117/12.860934en_US
dc.identifier.journalOPTICAL TRAPPING AND OPTICAL MICROMANIPULATION VIIen_US
dc.citation.volume7762en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000285837400058-
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