完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Cheng, Shu-Feng | en_US |
dc.contributor.author | Huang, Po-Tsang | en_US |
dc.contributor.author | Wang, Li-Chun | en_US |
dc.contributor.author | Chang, Mau-Chung Frank | en_US |
dc.date.accessioned | 2020-01-02T00:04:24Z | - |
dc.date.available | 2020-01-02T00:04:24Z | - |
dc.date.issued | 2019-12-01 | en_US |
dc.identifier.issn | 2168-2356 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/MDAT.2019.2932935 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/153438 | - |
dc.description.abstract | Editor's note: Multiband radio-frequency interconnect (MRFI) is an emerging technology to achieve low-latency and energy-efficient on-chip communication. This article proposes a BIST method to improve the reliability of MRFI-based design. -Partha Pratim Pande, Washington State University | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Through-silicon vias | en_US |
dc.subject | Built-in self-test | en_US |
dc.subject | Maintenance engineering | en_US |
dc.subject | Three-dimensional displays | en_US |
dc.subject | Circuit faults | en_US |
dc.subject | Bandwidth | en_US |
dc.subject | Frequency division multiplexing | en_US |
dc.subject | multiband RF-Interconnect | en_US |
dc.subject | test methodology | en_US |
dc.subject | TSV density | en_US |
dc.subject | yield improvement | en_US |
dc.subject | PRBS | en_US |
dc.subject | phase error | en_US |
dc.subject | BIST | en_US |
dc.subject | R | en_US |
dc.subject | e-fuse | en_US |
dc.title | Built-In Self-Test/Repair Methodology for Multiband RF-Interconnected TSV 3D Integration | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/MDAT.2019.2932935 | en_US |
dc.identifier.journal | IEEE DESIGN & TEST | en_US |
dc.citation.volume | 36 | en_US |
dc.citation.issue | 6 | en_US |
dc.citation.spage | 63 | en_US |
dc.citation.epage | 71 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 電機資訊學士班 | zh_TW |
dc.contributor.department | 電機工程學系 | zh_TW |
dc.contributor.department | 國際半導體學院 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Undergraduate Honors Program of Electrical Engineering and Computer Science | en_US |
dc.contributor.department | Department of Electrical and Computer Engineering | en_US |
dc.contributor.department | International College of Semiconductor Technology | en_US |
dc.identifier.wosnumber | WOS:000499992900007 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |