Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lin, Bi-Hsuan | en_US |
dc.contributor.author | Wu, Yu-Hao | en_US |
dc.contributor.author | Li, Xiao-Yun | en_US |
dc.contributor.author | Hsu, Hsu-Cheng | en_US |
dc.contributor.author | Chiu, Yu-Cheng | en_US |
dc.contributor.author | Lee, Chien-Yu | en_US |
dc.contributor.author | Chen, Bo-Yi | en_US |
dc.contributor.author | Yin, Gung-Chian | en_US |
dc.contributor.author | Tseng, Shao-Chin | en_US |
dc.contributor.author | Chang, Shih-Hung | en_US |
dc.contributor.author | Tang, Mau-Tsu | en_US |
dc.contributor.author | Hsieh, Wen-Feng | en_US |
dc.date.accessioned | 2020-02-02T23:54:27Z | - |
dc.date.available | 2020-02-02T23:54:27Z | - |
dc.date.issued | 2020-01-01 | en_US |
dc.identifier.issn | 0909-0495 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1107/S1600577519013675 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/153488 | - |
dc.description.abstract | Time-resolved X-ray excited optical luminescence (TR-XEOL) was developed successfully for the 23A X-ray nanoprobe beamline located at the Taiwan Photon Source (TPS). The advantages of the TR-XEOL facility include (i) a nano-focused X-ray beam (<60 nm) with excellent spatial resolution and (ii) a streak camera that can simultaneously record the XEOL spectrum and decay time. Three time spans, including normal (30 ps to 2 ns), hybrid (30 ps to 310 ns) and single (30 ps to 1.72 mu s) bunch modes, are available at the TPS, which can fulfil different experimental conditions involving samples with various lifetimes. It is anticipated that TR-XEOL at the TPS X-ray nanoprobe could provide great characterization capabilities for investigating the dynamics of photonic materials. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | XEOL | en_US |
dc.subject | TR-XEOL | en_US |
dc.subject | XRF | en_US |
dc.subject | streak camera | en_US |
dc.title | Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1107/S1600577519013675 | en_US |
dc.identifier.journal | JOURNAL OF SYNCHROTRON RADIATION | en_US |
dc.citation.volume | 27 | en_US |
dc.citation.spage | 217 | en_US |
dc.citation.epage | 221 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | 光電工程研究所 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.contributor.department | Institute of EO Enginerring | en_US |
dc.identifier.wosnumber | WOS:000505777800027 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Articles |