標題: Distribution of electronic reconstruction at the n-type LaAlO(3)/SrTiO(3) interface revealed by hard x-ray photoemission spectroscopy
作者: Chu, Y. Y.
Liao, Y. F.
Tra, V. T.
Yang, J. C.
Liu, W. Z.
Chu, Y. H.
Lin, J. Y.
Huang, J. H.
Weinen, J.
Agrestini, S.
Tsuei, K. -D.
Huang, D. J.
材料科學與工程學系
物理研究所
Department of Materials Science and Engineering
Institute of Physics
公開日期: 26-十二月-2011
摘要: We investigated the electronic reconstruction at the n-type LaAlO(3)/SrTiO(3) interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti(4+) to Ti(3+) occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO(3) with a depth of about 48 angstrom (similar to 12 unit cells) and an estimated total charge transfer of similar to 0.24 electrons per two-dimensional unit cell. (C) 2011 American Institute of Physics. [doi:10.1063/1.3672099]
URI: http://dx.doi.org/10.1063/1.3672099
http://hdl.handle.net/11536/15352
ISSN: 0003-6951
DOI: 10.1063/1.3672099
期刊: APPLIED PHYSICS LETTERS
Volume: 99
Issue: 26
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