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dc.contributor.authorYadav, Manojen_US
dc.contributor.authorVelampati, Ravi Shankar R.en_US
dc.contributor.authorMandal, Debaprasaden_US
dc.date.accessioned2020-02-02T23:54:39Z-
dc.date.available2020-02-02T23:54:39Z-
dc.date.issued2019-10-23en_US
dc.identifier.urihttp://dx.doi.org/10.1049/mnl.2019.0148en_US
dc.identifier.urihttp://hdl.handle.net/11536/153599-
dc.description.abstractThe present work details the synthesis of cobalt quantum-dots (Co QDs) with size downscaling to 1-2 nm and their applications in non-volatile memory (NVM) devices. The process of colloidal synthesis is simple and provides the control over a wide range of QDs size. The scaled-down colloidal Co QDs are applied for the NVM device fabrication. Colloidal synthesised Co QDs are spin-coated over silicon dioxide wafer for the fabrication of floating-gate NVM devices. Capacitance-voltage (C-V) and capacitance-time (C-t) measurements of the fabricated NVM device indicate a low voltage operation of device. A sweep voltages as small as 1.2-4 V lead to a flat band voltage shift of 0.35-1.5 V, evidencing the low operating voltage and low power NVM applications. Further, retention characteristics show a robust retention by fabricated NVM device. In addition, C-V measurements are done for the several samples in order to study the process repeatability. The work also is compared with the other processes for the floating gate memory device.en_US
dc.language.isoen_USen_US
dc.subjectsemiconductor quantum dotsen_US
dc.subjectcolloidsen_US
dc.subjectsilicon compoundsen_US
dc.subjectrandom-access storageen_US
dc.subjectintegrated circuit measurementen_US
dc.subjectlow-power electronicsen_US
dc.subjectcobalten_US
dc.subjectSiO2en_US
dc.subjectCoen_US
dc.subjectvoltage 0en_US
dc.subject35 V to 4en_US
dc.subject0 Ven_US
dc.subjectsize 1en_US
dc.subject0 nm to 2en_US
dc.subject0 nmen_US
dc.subjectretention characteristicsen_US
dc.subjectC-t measurementsen_US
dc.subjectcapacitance-time measurementsen_US
dc.subjectC-V measurementsen_US
dc.subjectcapacitance-voltage measurementsen_US
dc.subjectfloating-gate NVM device fabricationen_US
dc.subjectscaled-down colloidal cobalt QDsen_US
dc.subjectcobalt quantum-dot synthesisen_US
dc.subjectfloating gate memory deviceen_US
dc.subjectlow power NVM applicationsen_US
dc.subjectsweep voltagesen_US
dc.subjectnonvolatile memory device applicationen_US
dc.subjectcolloidal routeen_US
dc.titleScaling down of cobalt quantum-dots by colloidal route for non-volatile memory device applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1049/mnl.2019.0148en_US
dc.identifier.journalMICRO & NANO LETTERSen_US
dc.citation.volume14en_US
dc.citation.issue12en_US
dc.citation.spage1274en_US
dc.citation.epage1277en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000503179400013en_US
dc.citation.woscount0en_US
Appears in Collections:Articles