Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yadav, Manoj | en_US |
dc.contributor.author | Velampati, Ravi Shankar R. | en_US |
dc.contributor.author | Mandal, Debaprasad | en_US |
dc.date.accessioned | 2020-02-02T23:54:39Z | - |
dc.date.available | 2020-02-02T23:54:39Z | - |
dc.date.issued | 2019-10-23 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1049/mnl.2019.0148 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/153599 | - |
dc.description.abstract | The present work details the synthesis of cobalt quantum-dots (Co QDs) with size downscaling to 1-2 nm and their applications in non-volatile memory (NVM) devices. The process of colloidal synthesis is simple and provides the control over a wide range of QDs size. The scaled-down colloidal Co QDs are applied for the NVM device fabrication. Colloidal synthesised Co QDs are spin-coated over silicon dioxide wafer for the fabrication of floating-gate NVM devices. Capacitance-voltage (C-V) and capacitance-time (C-t) measurements of the fabricated NVM device indicate a low voltage operation of device. A sweep voltages as small as 1.2-4 V lead to a flat band voltage shift of 0.35-1.5 V, evidencing the low operating voltage and low power NVM applications. Further, retention characteristics show a robust retention by fabricated NVM device. In addition, C-V measurements are done for the several samples in order to study the process repeatability. The work also is compared with the other processes for the floating gate memory device. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | semiconductor quantum dots | en_US |
dc.subject | colloids | en_US |
dc.subject | silicon compounds | en_US |
dc.subject | random-access storage | en_US |
dc.subject | integrated circuit measurement | en_US |
dc.subject | low-power electronics | en_US |
dc.subject | cobalt | en_US |
dc.subject | SiO2 | en_US |
dc.subject | Co | en_US |
dc.subject | voltage 0 | en_US |
dc.subject | 35 V to 4 | en_US |
dc.subject | 0 V | en_US |
dc.subject | size 1 | en_US |
dc.subject | 0 nm to 2 | en_US |
dc.subject | 0 nm | en_US |
dc.subject | retention characteristics | en_US |
dc.subject | C-t measurements | en_US |
dc.subject | capacitance-time measurements | en_US |
dc.subject | C-V measurements | en_US |
dc.subject | capacitance-voltage measurements | en_US |
dc.subject | floating-gate NVM device fabrication | en_US |
dc.subject | scaled-down colloidal cobalt QDs | en_US |
dc.subject | cobalt quantum-dot synthesis | en_US |
dc.subject | floating gate memory device | en_US |
dc.subject | low power NVM applications | en_US |
dc.subject | sweep voltages | en_US |
dc.subject | nonvolatile memory device application | en_US |
dc.subject | colloidal route | en_US |
dc.title | Scaling down of cobalt quantum-dots by colloidal route for non-volatile memory device application | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1049/mnl.2019.0148 | en_US |
dc.identifier.journal | MICRO & NANO LETTERS | en_US |
dc.citation.volume | 14 | en_US |
dc.citation.issue | 12 | en_US |
dc.citation.spage | 1274 | en_US |
dc.citation.epage | 1277 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000503179400013 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Articles |