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dc.contributor.authorAhn, H.en_US
dc.contributor.authorChia, J. -W.en_US
dc.contributor.authorLee, H. -M.en_US
dc.contributor.authorHong, Y. -L.en_US
dc.contributor.authorGwo, S.en_US
dc.date.accessioned2014-12-08T15:21:37Z-
dc.date.available2014-12-08T15:21:37Z-
dc.date.issued2011-12-05en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3669538en_US
dc.identifier.urihttp://hdl.handle.net/11536/15362-
dc.description.abstractTerahertz time-domain spectroscopy (THz-TDS) has been used to investigate electrical properties of Mg-doped indium nitride (InN). Mg-doping in InN was found to significantly increase terahertz transmittance. THz-TDS analysis based on the Drude model shows that this high transmittance from Mg-doped InN is mainly due to the reduction in mobility associated with ionized dopants. The Hall-effect-measured mobility is typically lower than the THz-TDS-measured mobility for the same samples. However, the results of both measurements have the same slope in the linear relation between mobility and density. By introducing a compensation ratio of similar to 0.2, an excellent agreement in mobilities of two methods is obtained. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3669538]en_US
dc.language.isoen_USen_US
dc.titleMg-induced terahertz transparency of indium nitride filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.3669538en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume99en_US
dc.citation.issue23en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000298006100045-
dc.citation.woscount0-
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