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dc.contributor.authorShmid, Volodymyren_US
dc.contributor.authorKuryliuk, Vasylen_US
dc.contributor.authorNadtochiy, Andriyen_US
dc.contributor.authorKorotchenkov, Olegen_US
dc.contributor.authorLi, Pei-Wenen_US
dc.date.accessioned2020-02-02T23:55:35Z-
dc.date.available2020-02-02T23:55:35Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-7281-2065-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/153691-
dc.description.abstractStructuring Si surfaces with Ge quantum dots can have a beneficial effect on the photovoltage (PV), increasing the PV magnitude and decay time. The origin of this behavior is intimately related to mechanical strains developed in the vicinity of the Ge/Si interface. The structuring is a promising means of avoiding the uncontrolled production of recombination centers and offering significant enhancement of the recombination lifetime due to carrier trapping in the dots. This work can open new opportunities for advanced photoelectric devices with recombination center free nanostructures.en_US
dc.language.isoen_USen_US
dc.subjectphotovoltageen_US
dc.subjectSiGeen_US
dc.subjectdecay timeen_US
dc.subjectcarrier separationen_US
dc.subjectcarrier trappingen_US
dc.titleImproving Photoelectric Energy Conversion by structuring Si Surfaces with Ge Quantum Dotsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE 39TH INTERNATIONAL CONFERENCE ON ELECTRONICS AND NANOTECHNOLOGY (ELNANO)en_US
dc.citation.spage92en_US
dc.citation.epage96en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000502806100017en_US
dc.citation.woscount0en_US
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