完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChen, L. J.en_US
dc.contributor.authorWu, W. W.en_US
dc.date.accessioned2014-12-08T15:21:40Z-
dc.date.available2014-12-08T15:21:40Z-
dc.date.issued2009-07-01en_US
dc.identifier.issn1431-9276en_US
dc.identifier.urihttp://dx.doi.org/10.1017/S14319276090959688en_US
dc.identifier.urihttp://hdl.handle.net/11536/15392-
dc.language.isoen_USen_US
dc.titleIn Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructuresen_US
dc.typeArticleen_US
dc.identifier.doi10.1017/S14319276090959688en_US
dc.identifier.journalMICROSCOPY AND MICROANALYSISen_US
dc.citation.volume15en_US
dc.citation.issueen_US
dc.citation.spage1220en_US
dc.citation.epage1221en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000208119100601-
dc.citation.woscount0-
顯示於類別:期刊論文