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dc.contributor.authorChan, Yu-Weien_US
dc.contributor.authorChien, Feng-Tsunen_US
dc.contributor.authorYang, Chao-Tungen_US
dc.date.accessioned2020-05-05T00:01:32Z-
dc.date.available2020-05-05T00:01:32Z-
dc.date.issued2019-12-02en_US
dc.identifier.urihttp://dx.doi.org/10.3390/s19245417en_US
dc.identifier.urihttp://hdl.handle.net/11536/153978-
dc.description.abstractIn this paper, we investigate the mode selection strategies for a new device-to-device (D2D) pair becoming active in a network with a number of existing D2D sensors or users coexisting with cellular users in a D2D-enabled heterogeneous network. Specifically, we propose two selection rules, the signal-to-interference-plus-noise-ratio (SINR)-based and the capacity-based, combined with two sets of different precoding schemes and discuss their impacts on the system under a variety of scenarios. While the cooperative block diagonalization (BD) among the cellular users combined with the zero-forcing (ZF) precoding among D2D users can eliminate interference observed at the new D2D receiving sensor, the maximum signal-to-leakage-and-noise-ratio (SLNR) precoding is often a preferred option due to low-complexity implementations and comparable performance. We note that the two selection rules, the SINR-based and the capacity-based, considered in this paper impact on the system differently, with interesting tradeoff from different perspectives. Finally, we provide insights by simulations into the best selection among the three modes depending on a variety of use cases in the network.en_US
dc.language.isoen_USen_US
dc.subjectdevice-to-deviceen_US
dc.subjectunderlayen_US
dc.subjectmode selectionen_US
dc.subjectsignal-to-interference-plus-noise-ratio (SINR)en_US
dc.subjectblock diagonalization (BD)en_US
dc.subjectzero-forcing beamforming (ZFBF)en_US
dc.subjectsignal-to-leakage-and-noise-ratio (SLNR)en_US
dc.subjectinterference managementen_US
dc.titleMode Selection and Spectrum Allocation in Coexisting D2D and Cellular Networks with Cooperative Precodingen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s19245417en_US
dc.identifier.journalSENSORSen_US
dc.citation.volume19en_US
dc.citation.issue24en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000517961400080en_US
dc.citation.woscount0en_US
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