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dc.contributor.authorOuyang, Yen-Chiehen_US
dc.contributor.authorChen, Bo-Hanen_US
dc.contributor.authorLee, Meng-Chuehen_US
dc.contributor.authorLiu, Tsang-Senen_US
dc.contributor.authorOu-Yang, Mangen_US
dc.contributor.authorChen, Hsian-Minen_US
dc.contributor.authorWu, Chao-Chengen_US
dc.contributor.authorWen, Chia-Hsienen_US
dc.contributor.authorShih, Min-Shaoen_US
dc.contributor.authorChang, Chein-, Ien_US
dc.contributor.authorYan, Yung-Jheen_US
dc.date.accessioned2020-05-05T00:01:56Z-
dc.date.available2020-05-05T00:01:56Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-5386-9154-0en_US
dc.identifier.issn2153-6996en_US
dc.identifier.urihttp://hdl.handle.net/11536/153990-
dc.description.abstractFusarium wilt on Phalaenopsis is a disease that makes farmers suffer seriously. Although Phalaenopsis does not die immediately with Fusarium wilt, it seriously decreases the quality that buyers cannot accept. In this paper, we introduce an emerging method to detect Fusarium wilt at the base of Phalaenopsis stems. The detection model divides Phalaenopsis samples into two categories, healthy and infection. The band selection (BS) processing technique based on band prioritization (BP) is applied to extract significant bands and eliminate redundant bands. Subsequently, some algorithms which are constrained energy minimization (CEM), spectral information divergence(SID) and SeQuential N-FINDER to detect the Fusarium wilt, and we hope the research would help farmers decrease their losses.en_US
dc.language.isoen_USen_US
dc.subjectAgricultural product inspectionen_US
dc.subjectHyperspectral imageen_US
dc.subjectFusarium Wilt on Phalaenopsisen_US
dc.subjectBand Prioritizationen_US
dc.subjectBand Selectionen_US
dc.subjectCEMen_US
dc.subjectSIDen_US
dc.subjectSeQuential N-FINDERen_US
dc.titleQUALITY INSPECTION OF PHALAENOPSIS HYBRIDS USING HYPERSPECTRAL BAND SELECTION TECHNIQUESen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM (IGARSS 2019)en_US
dc.citation.spage2201en_US
dc.citation.epage2204en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000519270602090en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper