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dc.contributor.authorChi, Hao-Yuen_US
dc.contributor.authorLin, Zi-Junen_US
dc.contributor.authorHung, Chia-Haoen_US
dc.contributor.authorLiu, Chien-Nan Jimmyen_US
dc.contributor.authorChen, Hung-Mingen_US
dc.date.accessioned2020-05-05T00:02:00Z-
dc.date.available2020-05-05T00:02:00Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-7281-2350-9en_US
dc.identifier.issn1933-7760en_US
dc.identifier.urihttp://hdl.handle.net/11536/154062-
dc.description.abstractIn order to improve design productivity, proper layout automation tools are desired for analog circuits. Layout migration is one possible approach to generate a new layout for given circuits with different device sizes or different technology, and still keep the original layout topology. However, routing behaviors are often not mentioned in previous works, which requires a complete rerouting that may not follow the original style. Pan [16] first proposed a Constrained Delaunay Triangulation (CDT) based model to keep the routing behavior during layout migration. However, because the device sizes and related distance may be different in the new layout, some reference lines in CDT models may be removed, resulting in some missing nets after migration. In this paper, a novel Cartesian Detection Line (CDL) based model is proposed to preserve the routing behavior in original layouts. Because alternative lines in the modified placement can be easily found to prevent from missing nets, the proposed CDL model greatly improves the routing completeness during layout migration. Several routing refinement techniques are also proposed to solve the routing issues due to block displacement. In our experiments, the routing completeness can be improved to almost 100% with the proposed CDL model, which greatly reduces the design efforts.en_US
dc.language.isoen_USen_US
dc.titleAchieving Routing Integrity in Analog Layout Migration via Cartesian Detection Linesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000524676400047en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper