完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Yeh, Yao-Ming | en_US |
dc.contributor.author | Ueda, Mitsuru | en_US |
dc.contributor.author | Hsu, Chain-Shu | en_US |
dc.date.accessioned | 2020-05-05T00:02:17Z | - |
dc.date.available | 2020-05-05T00:02:17Z | - |
dc.date.issued | 2020-04-01 | en_US |
dc.identifier.issn | 2642-4150 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1002/pol.20190230 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/154092 | - |
dc.description.abstract | A positive-type photosensitive polyimide (PSPI) based on a chain extendable poly(amic acid) (PAA), a thermally degradable cross-linker 1,3,5-tris[(2-vinyloxy)ethoxy]benzene (TVEB), and a photoacid generator (PAG) (5-propylsulfonyloxyimino-5H-thiophene-2-ylidene)-(2-methylphenyl)acetonitrile (PTMA) has been developed. The chain extendable PAA was prepared from 3,3 ',4,4 '-biphenyltetracarboxylic dianhydride (BPDA) and 4,4 '-oxydianiline (ODA) and end-capped with di-tert-butyl dicarbonate (DIBOC) in N-methyl-2-pyrrolidone (NMP), which has a controlled molecular weight for developing in a 2.38 wt% tetramethyl ammonium hydroxide aqueous solution (TMAH( aq)) and undergoes a chain extending reaction during curing stage. The photosensitive resist solution was formulated with the polymerization solution (30 wt% in NMP), TVEB (15 wt% for the polymer), and PAG (4.5 wt% for the polymer). The PSPI showed a sensitivity of 47 mJ cm(-2) and a contrast of 5.8 when exposed to 365-nm light, followed by postexposure baking at 90 degrees C for 10 min and development with the 2.38 wt% TMAH( aq) at room temperature. A fine-positive image with 3-mu m line-and-space patterns was obtained on a 3-mu m thick film exposed to UV light at 365 nm in the contact-printed mode. After thermal curing at 350 degrees C for 1 hr, the resulting PSPI features excellent mechanical strength and elongation. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | chain-extendable poly(amic acid) | en_US |
dc.subject | cross-linker | en_US |
dc.subject | generator | en_US |
dc.subject | photoacid | en_US |
dc.subject | photoresist | en_US |
dc.subject | positive-type photosensitive polyimide | en_US |
dc.title | Alkaline-developable positive-type photosensitive polyimide with high mechanical strength and high resolution based on chain extendable poly(amic acid), thermally degradable cross-linker and photoacid generator | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1002/pol.20190230 | en_US |
dc.identifier.journal | JOURNAL OF POLYMER SCIENCE | en_US |
dc.citation.volume | 58 | en_US |
dc.citation.issue | 7 | en_US |
dc.citation.spage | 948 | en_US |
dc.citation.epage | 955 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.identifier.wosnumber | WOS:000524563300004 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 期刊論文 |