Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Zhuo, Guan-Yu	en_US
dc.contributor.author	Yang, Zu-Po	en_US
dc.contributor.author	Chan, Ming-Che	en_US
dc.date.accessioned	2020-07-01T05:20:34Z	-
dc.date.available	2020-07-01T05:20:34Z	-
dc.date.issued	2018-01-01	en_US
dc.identifier.isbn	978-1-9435-8042-2	en_US
dc.identifier.issn	2160-9020	en_US
dc.identifier.uri	http://hdl.handle.net/11536/154263	-
dc.description.abstract	For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.	en_US
dc.language.iso	en_US	en_US
dc.title	Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)	en_US
dc.citation.spage	0	en_US
dc.citation.epage	0	en_US
dc.contributor.department	光電系統研究所	zh_TW
dc.contributor.department	Institute of Photonic System	en_US
dc.identifier.wosnumber	WOS:000526031001479	en_US
dc.citation.woscount	0	en_US
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