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dc.contributor.authorZhuo, Guan-Yuen_US
dc.contributor.authorYang, Zu-Poen_US
dc.contributor.authorChan, Ming-Cheen_US
dc.date.accessioned2020-07-01T05:20:34Z-
dc.date.available2020-07-01T05:20:34Z-
dc.date.issued2018-01-01en_US
dc.identifier.isbn978-1-9435-8042-2en_US
dc.identifier.issn2160-9020en_US
dc.identifier.urihttp://hdl.handle.net/11536/154263-
dc.description.abstractFor thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.en_US
dc.language.isoen_USen_US
dc.titleHotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscopeen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.identifier.wosnumberWOS:000526031001479en_US
dc.citation.woscount0en_US
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