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dc.contributor.authorKuo, Yu-Hongen_US
dc.contributor.authorChiu, Shih-Hsuanen_US
dc.contributor.authorTien, Che-Weien_US
dc.contributor.authorLin, Sheng-Dien_US
dc.contributor.authorChang, Wen-Haoen_US
dc.contributor.authorGeorge, Thomasen_US
dc.contributor.authorLin, Horng-Chihen_US
dc.contributor.authorLi, Pei-Wenen_US
dc.date.accessioned2020-07-01T05:21:20Z-
dc.date.available2020-07-01T05:21:20Z-
dc.date.issued2020-03-01en_US
dc.identifier.urihttp://dx.doi.org/10.1088/2399-1984/ab794den_US
dc.identifier.urihttp://hdl.handle.net/11536/154417-
dc.description.abstractWe report local nitride-stressor engineering in combination with quantum-size tunability in Ge quantum dots (QDs) for tailoring photoluminescence (PL) wavelength and exciton lifetime. Spherical-shaped Ge QDs with tunable diameters ranging from 25-90 nm embedded within layers of thermally-grown SiO2 and chemical-vapor-deposited Si3N4 were fabricated by thermal oxidation of lithographically-patterned poly-Si0.85Ge0.15 pillars on top of buffer layers of SiO2 and Si3N4, respectively, in a self-organization approach. The effects of local stressors and quantum confinement on the strain and optical properties of Ge QDs were systematically investigated using Raman and PL measurements. We observed that when Ge QD diameter gets smaller than 60 nm, quantum confinement sets in and has a predominant influence on PL wavelength and exciton lifetime. Our self-organized Ge QD/Si3N4 system provides a generic building block for the fabrication of active photonic devices on Si3N4 platform.en_US
dc.language.isoen_USen_US
dc.subjectgermaniumen_US
dc.subjectquantum doten_US
dc.subjectSi3N4en_US
dc.subjectstrainen_US
dc.subjectquantum confinementen_US
dc.titleNitride-stressor and quantum-size engineering in Ge quantum-dot photoluminescence wavelength and exciton lifetimeen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/2399-1984/ab794den_US
dc.identifier.journalNANO FUTURESen_US
dc.citation.volume4en_US
dc.citation.issue1en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000528051400001en_US
dc.citation.woscount0en_US
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