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dc.contributor.authorLi, Zong-Linen_US
dc.contributor.authorLin, Shen-Chiehen_US
dc.contributor.authorChen, Yu-Chenen_US
dc.contributor.authorLin, Grayen_US
dc.date.accessioned2020-07-01T05:21:49Z-
dc.date.available2020-07-01T05:21:49Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-5106-3141-0en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.2539876en_US
dc.identifier.urihttp://hdl.handle.net/11536/154488-
dc.description.abstractThe device characteristics of GaSb-based mid-infrared (MIR) photonic-crystal (PC) surface-emitting lasers (SELs) were investigated with respect to depths of etched PC holes. Measurement of below-threshold emission spectra identifies the bandgap as well as band-edge modes. The bandgap separation, which is a function of feedback coupling, increases with increasing depth. From within, the Bragg frequencies and their detuning from lasing frequencies can be determined. Moreover, with increasing depth, the threshold pumping density decreases exponentially to a saturation level, which is assigned to minimum device modal gain of certain value. The relative threshold gain is then plotted as a function of normalized frequency detuning. The gain-detuning relationship of PCSELs is similar to that of one-dimensional (1D) distributed feedback (DFB) lasers.en_US
dc.language.isoen_USen_US
dc.subjectphotonic crystalsen_US
dc.subjectsurface-emitting lasersen_US
dc.subjectmid-infrared lasersen_US
dc.subjectGaSb-based lasersen_US
dc.titleRelationship between Threshold Gain and Bragg Detuning in Photonic-Crystal Surface-Emitting Lasersen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.2539876en_US
dc.identifier.journalAOS AUSTRALIAN CONFERENCE ON OPTICAL FIBRE TECHNOLOGY (ACOFT) AND AUSTRALIAN CONFERENCE ON OPTICS, LASERS, AND SPECTROSCOPY (ACOLS) 2019en_US
dc.citation.volume11200en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000534205100073en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper