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dc.contributor.authorHuang, Kou-Yuanen_US
dc.contributor.authorHsieh, Yueh-Hsunen_US
dc.date.accessioned2014-12-08T15:21:44Z-
dc.date.available2014-12-08T15:21:44Z-
dc.date.issued2011en_US
dc.identifier.isbn978-1-4577-1005-6en_US
dc.identifier.urihttp://hdl.handle.net/11536/15462-
dc.description.abstractWe use three global optimization methods in the pattern parameter detection system, including simulated annealing (SA), fast simulated annealing (FSA) and very fast simulated annealing (VFSA). The sequential pattern parameter detection system can detect three types of patterns that include the lines, hyperbolas and ellipses in image. We use steps in the parameter detection for reducing the computation and getting fast convergence. This system has the capability of searching pattern parameter vectors with global minimal distance between the patterns and the image data. After the system is successful in image pattern detection, we apply it to detect the parameters of the hyperbolic patterns on real one-shot seismogram and seismic common depth point (CDP) gather data. This procedure provides an automatic velocity analysis method and improves the seismic interpretation and further seismic data processing.en_US
dc.language.isoen_USen_US
dc.subjectsimulated annealingen_US
dc.subjectfast simulated annealingen_US
dc.subjectvery fast simulated annealingen_US
dc.subjectcommon depth point(CDP)en_US
dc.subjectvelocity analysisen_US
dc.titleVERY FAST SIMULATED ANNEALING FOR PATTERN DETECTION AND SEISMIC APPLICATIONSen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2011 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM (IGARSS)en_US
dc.citation.spage499en_US
dc.citation.epage502en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000297496300121-
Appears in Collections:Conferences Paper