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dc.contributor.authorZheng, Yi-Congen_US
dc.contributor.authorLai, Ching-Yien_US
dc.contributor.authorBrun, Todd A.en_US
dc.contributor.authorKwek, Leong-Chuanen_US
dc.date.accessioned2020-10-05T02:01:03Z-
dc.date.available2020-10-05T02:01:03Z-
dc.date.issued2020-10-01en_US
dc.identifier.issn2058-9565en_US
dc.identifier.urihttp://dx.doi.org/10.1088/2058-9565/aba34den_US
dc.identifier.urihttp://hdl.handle.net/11536/155094-
dc.description.abstractFault-tolerant quantum computation (FTQC) schemes using large block codes that encodek> 1 qubits innphysical qubits can potentially reduce the resource overhead to a great extent because of their high encoding rate. However, the fault-tolerant (FT) logical operations for the encoded qubits are difficult to find and implement, which usually takes not only a very large resource overhead but also longin situcomputation time. In this paper, we focus on Calderbank-Shor-Steane [[n,k,d]] (CSS) codes and their logical FT Clifford circuits. We show that the depth of an arbitrary logical Clifford circuit can be implemented fault-tolerantly inO(1) stepsin situvia either Knill or Steane syndrome measurement circuit, with the qualified ancilla states efficiently prepared. Particularly, for those codes satisfyingk/n similar to Theta(1), the resource scaling for Clifford circuits implementation on the logical level can be the same as on the physical level up to a constant, which is independent of code distanced. With a suitable pipeline to produce ancilla states, our scheme requires only a modest resource cost in physical qubits, physical gates, and computation time for very large scale FTQC.en_US
dc.language.isoen_USen_US
dc.subjectfault-tolerant quantum computationen_US
dc.subjectlarge block codesen_US
dc.subjectquantum error correctionen_US
dc.subjectClifford circuiten_US
dc.titleConstant depth fault-tolerant Clifford circuits for multi-qubit large block codesen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/2058-9565/aba34den_US
dc.identifier.journalQUANTUM SCIENCE AND TECHNOLOGYen_US
dc.citation.volume5en_US
dc.citation.issue4en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000556798200001en_US
dc.citation.woscount0en_US
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