Total-Dose Effect of X-ray Irradiation on Low-TemperaturePolycrystalline Silicon Thin-Film Transistors (vol 41, pg 864, 2020)

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DC Field	Value	Language
dc.contributor.author	Tai, Ya-Hsiang	en_US
dc.contributor.author	Yeh, Shan	en_US
dc.contributor.author	Huang, Shih-Hsuan	en_US
dc.contributor.author	Chang, Ting-Chang	en_US
dc.date.accessioned	2020-10-05T02:02:04Z	-
dc.date.available	2020-10-05T02:02:04Z	-
dc.date.issued	2020-09-01	en_US
dc.identifier.issn	0741-3106	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/LED.2020.3012271	en_US
dc.identifier.uri	http://hdl.handle.net/11536/155488	-
dc.description.abstract	In The above article [1], the Acknowledgment was deleted in error. Therefore, the Acknowledgment is added below. This change had no influence on the discussion and conclusions in the article.	en_US
dc.language.iso	en_US	en_US
dc.title	Total-Dose Effect of X-ray Irradiation on Low-TemperaturePolycrystalline Silicon Thin-Film Transistors (vol 41, pg 864, 2020)	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/LED.2020.3012271	en_US
dc.identifier.journal	IEEE ELECTRON DEVICE LETTERS	en_US
dc.citation.volume	41	en_US
dc.citation.issue	9	en_US
dc.citation.spage	1448	en_US
dc.citation.epage	1448	en_US
dc.contributor.department	電機學院	zh_TW
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	College of Electrical and Computer Engineering	en_US
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000564210900043	en_US
dc.citation.woscount	0	en_US
Appears in Collections:	Articles