標題: An Effective Procedure for Calculating Weibull Production Yield with Mean Shift
作者: Hsu, Ya-Chen
Pearn, W. L.
Li, Yuan-Yi
工業工程與管理學系
Department of Industrial Engineering and Management
關鍵字: production yield;non-normal;Weibull distribution;mean shift;process capability index
公開日期: 1-五月-2012
摘要: Motorola, Inc. introduced its six sigma production quality initiative to the world in the 1980s. Six sigma production quality is estimated by assuming a 1.5 sigma shift to the process mean. Bothe provided a statistical reason for considering such a shift in the normal process mean, and he also provided a much more accurate capability calculation to measure the production yield (Bothe, D. R., "Statistical Reason for the 1.5 sigma Shift," Qual. Eng., Vol. 14(3), 2002, pp. 479-487). In this paper, we consider Weibull processes, which cover a wide class of non-normal processes. We calculate the mean shift adjustments under various sample sizes n and Weibull parameters, with the power fixed at 0.5. Then, we implement the derived results to develop an effective procedure to accurately calculate the production yield. Finally, to demonstrate the applicability of the proposed approach, the proposed procedure is applied to a real manufacturing process with mean shift.
URI: http://hdl.handle.net/11536/15981
ISSN: 0090-3973
期刊: JOURNAL OF TESTING AND EVALUATION
Volume: 40
Issue: 3
結束頁: 447
顯示於類別:期刊論文