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dc.contributor.authorSIMPSON, TBen_US
dc.contributor.authorLIU, JMen_US
dc.contributor.authorHUANG, KFen_US
dc.contributor.authorTAI, Ken_US
dc.contributor.authorCLAYTON, CMen_US
dc.contributor.authorGAVRIELIDES, Aen_US
dc.contributor.authorKOVANIS, Ven_US
dc.date.accessioned2019-04-03T06:39:05Z-
dc.date.available2019-04-03T06:39:05Z-
dc.date.issued1995-12-01en_US
dc.identifier.issn2469-9926en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevA.52.R4348en_US
dc.identifier.urihttp://hdl.handle.net/11536/1607-
dc.description.abstractThe injection of an optical signal into a semiconductor laser biased near or above the lasing threshold modifies the coupling between the free carriers and the intracavity field. The detuning between the frequency of the injected signal and the free-running oscillation frequency and the ratio of the photon lifetime to the carrier lifetime are key parameters in determining the enhancement of the carrier-field resonant coupling frequency and the stability of the output field. Experimental results using a vertical cavity surface emitting laser biased near threshold are in agreement with calculations using a lumped-element oscillator model.en_US
dc.language.isoen_USen_US
dc.titleCAVITY ENHANCEMENT OF RESONANT FREQUENCIES IN SEMICONDUCTOR-LASERS SUBJECT TO OPTICAL-INJECTIONen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevA.52.R4348en_US
dc.identifier.journalPHYSICAL REVIEW Aen_US
dc.citation.volume52en_US
dc.citation.issue6en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1995TK65200011en_US
dc.citation.woscount12en_US
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