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dc.contributor.authorHsieh, Meng-Chienen_US
dc.contributor.authorWang, Jia-Fengen_US
dc.contributor.authorWang, Yu-Shouen_US
dc.contributor.authorYang, Cheng-Hongen_US
dc.contributor.authorChiang, Chen-Haoen_US
dc.contributor.authorChen, Jenn-Fangen_US
dc.date.accessioned2014-12-08T15:22:53Z-
dc.date.available2014-12-08T15:22:53Z-
dc.date.issued2012-02-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/02BJ12en_US
dc.identifier.urihttp://hdl.handle.net/11536/16141-
dc.description.abstractThis study elucidates the electron emission properties of GaAsN/GaAs quantum well containing N-related localized states under illumination. The N-related localized states in a GaAsN quantum well (QW) are identified as both optical and electrical electron trap states. The mechanisms for the responses of current-voltage (I-V) measurement under illumination and photocapacitance are investigated. N-related localized states in GaAsN QW can extend response range and response sensitivity on photocapacitance, and produce an additional current path for photo-generated electron-hole pairs. Furthermore, exactly how illumination influences the electron emission rate of GaAsN QW electron state is examined. The electron emission rate of GaAsN QW electron state can be modulated by different incident photon energy, which is due to the modulation of depletion width of the bottom GaAs. (C) 2012 The Japan Society of Applied Physicsen_US
dc.language.isoen_USen_US
dc.titleElectron Emission Properties of GaAsN/GaAs Quantum Well Containing N-Related Localized States: The Influence of Illuminanceen_US
dc.typeArticleen_US
dc.identifier.doi02BJ12en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume51en_US
dc.citation.issue2en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000303481400077-
dc.citation.woscount0-
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