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dc.contributor.authorChang, Chiao-Yunen_US
dc.contributor.authorHuang, Huei-Minen_US
dc.contributor.authorLai, Chih Mingen_US
dc.contributor.authorLu, Tien-Changen_US
dc.date.accessioned2014-12-08T15:23:07Z-
dc.date.available2014-12-08T15:23:07Z-
dc.date.issued2012-07-01en_US
dc.identifier.issn0018-9197en_US
dc.identifier.urihttp://hdl.handle.net/11536/16260-
dc.description.abstractIn this paper, we investigated polarized light emission properties on a series of a-plane GaN/AlGaN multiple quantum wells grown on r-plane sapphire substrates with various well widths by using the polarization-dependent photoluminescence measurement. To clarify reasons of polarization properties in light emission, we applied the 6 x 6 k.p model to simulate the E-K dispersion relationship and wave functions to obtain optical transitions of different polarized emissions. According to our results, the sub-bands of vertical bar Y>-like states are raised toward the top of the valence sub-band level with increasing the well width. And the optical matrix element of y-polarized light emission will dominate the optical transition, leading to the increase of degree of polarization in the thicker well.en_US
dc.language.isoen_USen_US
dc.subjecta-Planeen_US
dc.subjectGaNen_US
dc.subjectGaN/AlGaN multiple quantum wellsen_US
dc.subjectnonpolaren_US
dc.subjectpolarizationen_US
dc.titleCharacteristics of Polarized Light Emission in a-Plane GaN-Based Multiple Quantum Wellsen_US
dc.typeArticleen_US
dc.identifier.journalIEEE JOURNAL OF QUANTUM ELECTRONICSen_US
dc.citation.volume48en_US
dc.citation.issue7en_US
dc.citation.epage867en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000304093200005-
dc.citation.woscount1-
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