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dc.contributor.authorRavipati, Srikanthen_US
dc.contributor.authorShieh, Jiannen_US
dc.contributor.authorKo, Fu-Hsiangen_US
dc.contributor.authorYu, Chen-Chiehen_US
dc.contributor.authorChen, Hsuen-Lien_US
dc.contributor.authorWu, Chia-Tienen_US
dc.contributor.authorChen, Szu-Hungen_US
dc.date.accessioned2014-12-08T15:23:12Z-
dc.date.available2014-12-08T15:23:12Z-
dc.date.issued2012-06-01en_US
dc.identifier.issn1754-5692en_US
dc.identifier.urihttp://hdl.handle.net/11536/16283-
dc.description.abstractGaAs nanograss with diameters of less than 20 nm has been fabricated using a simple, one-step, maskless plasma etching-based approach. GaAs nanograss exhibits remarkable broadband antireflection properties, which arise from the graded refractive index between air and the GaAs substrate by the nanograss layer. Moreover, GaAs nanograss shows less sensitivity to transverse electric polarized light and transverse magnetic polarized light over a wide range of incident angles compared to the strong variation in a bare GaAs substrate. These effects show that sub-20 nm GaAs nanograss with lengths of approximately 200 nm has an enhanced absorption of 98-100% when the incident energy is larger than the GaAs bandgap (lambda = 240-873 nm) and an enhanced absorption of 72-98% when the incident energy is less than the bandgap (lambda = 873-2400 nm). Our simple, one-step, and maskless plasma etching method opens a promising approach for the direct implementation of broad omnidirectional antireflective surfaces on solar cells and various optoelectronic devices to improve device performance.en_US
dc.language.isoen_USen_US
dc.titleBroadband and wide angle antireflection of sub-20 nm GaAs nanograssen_US
dc.typeArticleen_US
dc.identifier.journalENERGY & ENVIRONMENTAL SCIENCEen_US
dc.citation.volume5en_US
dc.citation.issue6en_US
dc.citation.epage7601en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000304354900032-
dc.citation.woscount10-
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