| Title: | 【Snapshots】Narasimhulu Thoti |
| Authors: | 國際事務處 Narasimhulu Thoti Office of International Affairs |
| Issue Date: | 27-Jun-2024 |
| Publisher: | 國立陽明交通大學 National Yang Ming Chiao Tung University |
| Abstract: | NYCU, particularly in the semiconductor industry, offers an excellent study experience with fundamental courses taught by renowned professors. |
| URI: | https://drive.google.com/file/d/1T9onYKP05gAFWC-8VHMBvUz0CBPE8_eh/view http://hdl.handle.net/11536/163060 |
| Journal: | 陽明交大英文電子報 NYCU E-NEWS |
| Issue: | 2024-06 |
| Appears in Collections: | NYCU E-NEWS |
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- Effects of a dual spacer on electrical characteristics and random telegraph noise of gate-all-around silicon nanowire p-type metal-oxide-semiconductor field-effect transistors / Kola, Sekhar Reddy;Li, Yiming;Thoti, Narasimhulu
- Random telegraph noise in gate-all-around silicon nanowire MOSFETs induced by a single charge trap or random interface traps / Kola, Sekhar Reddy;Li, Miming;Thoti, Narasimhulu
- Potential Source Regions Contributing to Seasonal Variations of Black Carbon Aerosols over Anantapur in Southeast India / Reddy, B. Suresh Kumar;Kumar, K. Raghavendra;Balakrishnaiah, G.;Gopal, K. Rama;Reddy, R. R.
- On the time complexity of minimum and maximum global snapshot problems / Chen, LB;Wu, IC
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