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| Random Interface-Traps-Induced Electrical Characteristic Fluctuation in 16-nm-Gate High-kappa/Metal Gate Complementary Metal-Oxide-Semiconductor Device and Inverter Circuit | 104 |
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| Random Interface-Traps-Induced Electrical Characteristic Fluctuation in 16-nm-Gate High-kappa/Metal Gate Complementary Metal-Oxide-Semiconductor Device and Inverter Circuit | 0 | 0 | 0 | 0 | 0 | 3 | 0 |
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