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dc.contributor.authorChang, Ai-Tangen_US
dc.contributor.authorChang, Yi-Renen_US
dc.contributor.authorChi, Sienen_US
dc.contributor.authorHsu, Longen_US
dc.date.accessioned2014-12-08T15:24:04Z-
dc.date.available2014-12-08T15:24:04Z-
dc.date.issued1970-01-01en_US
dc.identifier.issn1559-128Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/16733-
dc.description.abstract"In optical tweezers applications, tracking a trapped particle is essential for force measurement. One of the most popular techniques for single-particle tracking is achieved by analyzing the forward and backward light pattern, scattered by the target particle trapped by a trap laser beam, of an additional probe-laser beam with different wavelength whose focus is slightly apart from the trapping center. However, the optimized focal offset has never been discussed. In this paper, we investigate the tracking range and sensitivity as a function of the focal offset between the trapping and the probe-laser beams. As a result, the optimized focal offsets are a 3.3-fold radius ahead and a 2.0-fold radius behind the trapping laser focus in the forward tracking and the backward tracking, respectively. The experimental result agrees well with a theoretical prediction using the Mie scattering theory. (C) 2012 Optical Society of America"en_US
dc.language.isoen_USen_US
dc.titleOptimization of probe-laser focal offsets for single-particle trackingen_US
dc.typeArticleen_US
dc.identifier.journalAPPLIED OPTICSen_US
dc.citation.volume51en_US
dc.citation.issue23en_US
dc.citation.epage5643en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000307876000007-
dc.citation.woscount3-
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