完整後設資料紀錄
DC 欄位語言
dc.contributor.authorKuan, Meng-Jongen_US
dc.contributor.authorHsiang, Chia-Chunen_US
dc.contributor.authorTzeng, Gwo-Hshiungen_US
dc.date.accessioned2014-12-08T15:24:04Z-
dc.date.available2014-12-08T15:24:04Z-
dc.date.issued2012-08-01en_US
dc.identifier.issn1349-4198en_US
dc.identifier.urihttp://hdl.handle.net/11536/16738-
dc.description.abstract"In the highly competitive environment, new product development, technology, equipment and raw materials have progressed rapidly. It is a gradual trend that competitors continuously innovate on their product and product life cycle becomes shorter. The manager intends to achieve the highest customer satisfaction, product value and product continuity. In this study, we develop an effective quality assessment system to manage quality of new product development (NPD) process. First, the quality factors related to NPD process are selected by expert questionnaires. Second, the DEMATEL approach is used to explore the relevance of the quality factors of NPD process. Then, the DEMATEL is combined with ANP method to a new DANP approach to calculate the influential weights of quality factors. Finally, VIKOR is used to evaluate and improve the total performance of NPD process by using empirical analysis on a case study, to find out the performance gaps and to improve its scores. The results of this study will provide NPD team a guidance to continuously improve, track and meet the quality assurance of NPD process; consequently, the customers' needs can be satisfied."en_US
dc.language.isoen_USen_US
dc.subjectNew product development (NPD) processen_US
dc.subjectDecision making trial and evaluation laboratory (DEMATEL)en_US
dc.subjectDEMATEL-based ANP (DANP)en_US
dc.subjectVIKORen_US
dc.titlePROBING THE INNOVATIVE QUALITY SYSTEM STRUCTURE MODEL FOR NPD PROCESS BASED ON COMBINING DANP WITH MCDM MODELen_US
dc.typeArticleen_US
dc.identifier.journalINTERNATIONAL JOURNAL OF INNOVATIVE COMPUTING INFORMATION AND CONTROLen_US
dc.citation.volume8en_US
dc.citation.issue8en_US
dc.citation.epage5745en_US
dc.contributor.department科技管理研究所zh_TW
dc.contributor.departmentInstitute of Management of Technologyen_US
dc.identifier.wosnumberWOS:000307628800023-
dc.citation.woscount1-
顯示於類別:期刊論文