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dc.contributor.authorLiang, C. -T.en_US
dc.contributor.authorYeh, M. -R.en_US
dc.contributor.authorLin, S. D.en_US
dc.contributor.authorLin, S. W.en_US
dc.contributor.authorWu, J. Y.en_US
dc.contributor.authorLin, T. L.en_US
dc.contributor.authorChen, Kuang Yaoen_US
dc.date.accessioned2014-12-08T15:24:20Z-
dc.date.available2014-12-08T15:24:20Z-
dc.date.issued2012-08-01en_US
dc.identifier.issn0577-9073en_US
dc.identifier.urihttp://hdl.handle.net/11536/16912-
dc.description.abstractWe report on superconductivity in an aluminum film grown on a GaAs substrate by molecular beam epitaxy (MBE). We show that the quality of the MBE-grown sample is better than that of its counterpart prepared by electron gun evaporation. This is evidenced by the observed much lower resistivity, higher critical current, longer coherence length, and downward critical field-temperature characteristic H-c(T). Our results suggest that a MBE-grown Al thin film can be used to study superconductivity in a relatively clean metal.en_US
dc.language.isoen_USen_US
dc.titleSuperconductivity in an Aluminum Film Grown by Molecular Beam Epitaxyen_US
dc.typeArticleen_US
dc.identifier.journalCHINESE JOURNAL OF PHYSICSen_US
dc.citation.volume50en_US
dc.citation.issue4en_US
dc.citation.spage638en_US
dc.citation.epage642en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000309161900013-
dc.citation.woscount1-
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