完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, Yu-Hsuan | en_US |
dc.contributor.author | Tsai, Din Ping | en_US |
dc.date.accessioned | 2014-12-08T15:24:25Z | - |
dc.date.available | 2014-12-08T15:24:25Z | - |
dc.date.issued | 2012-07-16 | en_US |
dc.identifier.issn | 1094-4087 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1364/OE.20.016205 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/16936 | - |
dc.description.abstract | This study presents a novel near-field optics technology. A near-field cover glass slip (NF-CGS) was developed to improve the resolution of optical microscopy beyond the diffraction limit. A multi-layered structure of cover glass/ZnS-SiO2 (130 nm)/AgOx (15 nm)/ ZnS-SiO2 (40 nm) was employed to generate the optical coupling effect for increasing the contrast and enhancing resolution of imaging. This novel innovation is expected to be employed in near-field imaging techniques for samples in different environments because of its simplicity, rapid laser scanning, and minimal costs. Experimental results of 500 nm, 200 nm, and 100 nm standard polystyrene nanospheres on NF-CGS and normal cover glass are demonstrated and imaged by using a laser scanning confocal microscope. (C) 2012 Optical Society of America | en_US |
dc.language.iso | en_US | en_US |
dc.title | Near-field scanning optical microscopy using a super-resolution cover glass slip | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1364/OE.20.016205 | en_US |
dc.identifier.journal | OPTICS EXPRESS | en_US |
dc.citation.volume | 20 | en_US |
dc.citation.issue | 15 | en_US |
dc.citation.spage | 16205 | en_US |
dc.citation.epage | 16211 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000307055800008 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |