完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsieh, M. T. | en_US |
dc.contributor.author | Chang, C. C. | en_US |
dc.contributor.author | Hu, C. A. | en_US |
dc.contributor.author | Huang, Y. T. | en_US |
dc.contributor.author | Yang, S. L. | en_US |
dc.contributor.author | Chen, J. F. | en_US |
dc.contributor.author | Hwang, S. W. | en_US |
dc.contributor.author | Chen, C. H. | en_US |
dc.date.accessioned | 2014-12-08T15:24:38Z | - |
dc.date.available | 2014-12-08T15:24:38Z | - |
dc.date.issued | 2006 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/17116 | - |
dc.description.abstract | We report an efficient p-type doping of NPB layer using WO(3) as a p-dopant. We find that increasing the WO(3) volume percentage can reduce the activation energy of the NPB layer and increase the hole concentration in NPB layer. As a result, the hole-injection can be improved via tunneling through a narrow depletion region due to the increasing band bending which corresponds to the difference of Fermi level position between the ITO and the NPB layer. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Admittance spectroscopy of the electric properties of 1,4-bis[N-(1-naphthyl)-N '-phenylamino]-4,4 ' diamine doped with tungsten oxide | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | IDW '06: PROCEEDINGS OF THE 13TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3 | en_US |
dc.citation.spage | 1315 | en_US |
dc.citation.epage | 1318 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000258482700337 | - |
顯示於類別: | 會議論文 |