統計資料
總造訪次數
| 檢視 | |
|---|---|
| New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond | 114 |
本月總瀏覽
| 六月 2025 | 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | |
|---|---|---|---|---|---|---|---|
| New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyond | 0 | 0 | 0 | 0 | 2 | 1 | 0 |
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| China | 98 |
| United States | 13 |
| Ireland | 1 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 8 |
| Kensington | 3 |
| Beijing | 2 |
| Buffalo | 1 |
| University Park | 1 |