標題: Method to evaluate Cable Discharge Event (CDE) reliability of integrated circuits in CMOS technology
作者: Lai, Tai-Xiang
Ker, Ming-Dou
電機學院
College of Electrical and Computer Engineering
公開日期: 2006
摘要: Cable Discharge Event (CDE) has been the main cause which damages the Ethernet interface in field applications. The transmission line pulsing (TLP) system has been the most popular method to observe electric characteristics of the device under human-body-model (HBM) electrostatic discharge (ESD) stress. In this work, the long-pulse transmission line pulsing (LP-TLP) system is proposed to simulate CDE reliability of the Ethernet integrated circuits, and the results are compared with the conventional 100-ns TLP system. The experimental results have shown that the CDE robustness of NMOS device in a 0.25-mu m CMOS technology is worse than its HBMESD robustness.
URI: http://hdl.handle.net/11536/17381
ISBN: 0-7695-2523-7
期刊: ISQED 2006: Proceedings of the 7th International Symposium on Quality Electronic Design
起始頁: 597
結束頁: 602
Appears in Collections:Conferences Paper