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| Investigation of post-NBTI stress recovery in pMOSFETs by direct measurement of single oxide charge de-trapping | 111 |
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| Investigation of post-NBTI stress recovery in pMOSFETs by direct measurement of single oxide charge de-trapping | 111 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 中國 | 98 |
| 美國 | 13 |
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 6 |
| Kensington | 4 |
| Edmond | 3 |
| Zhengzhou | 2 |